Systolic Architectures and other classes
Microsoft systolic arrays on sparse data
Systolic Architectures and other classes
Microsoft systolic arrays on sparse data
Understanding 28-nm SoC Design With ARM-Based Cores
Flexible Abstract model to decrease the size of netlist.
Implementation challenges for large 28nm socs
Global clock channel could limit reroute of deisgn
Memory-to-flop paths have high logic levels and a memory delay of ~400ps.
create placement regions near the memories to ensure less buffering in the path, and achieve timing closure.
Clock gating issues also cause high congestion in the localized area.
different placement rules for different types of standard cells/macros, local power drop targets on top of the global targets, special clock tree design to take care of the skew and to minimize the number of buffers on clock tree.
clock tree synthesis for low power
"Optimal grouping clock tree sinks for clock gating during both the RTL design and synthesis stages offer significant advantages for power saving. The grouping and clock gating that can be coded manually by the RTL designer who knows the architecture and typical application scenarios for the device is the most critical part that contributes most to the power savings. "
At a block level, you also have them all on or off at once with a selection for it.
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What is the CTL output for DFT?
Integrated Power Management, Leakage Control and Process Compensation Technology for Advanced Processes aka what are FF, SS corners.
Why SF and FS are skewed corners? (slide 10)
Multi corner multi mode analysis
Power challenges at 10nm and below [“At that time the dynamic power could mainly be taken care of with I/Os, memories, and clocks. If you did something good in those areas, it was fine and you did what you could in order to get it under control. That’s changing, and the logic component (the data path logic and control logic) is becoming a pretty significant portion of the total dynamic power within the chip. "]
Design rule violatio fixing in timing closure
Testing analog circuits becoming more difficult
Performance Robustness Analysis of VLSI Circuits with Process Variations Based on Kharitonov Theorem