Textbook
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits by M. L. Bushnell and V.D. Agrawal, Kluwer Academic Press, Boston 2000
Recommended
System On Chip Test Architectures: Nanometer Design for Testability by L.T. Wang, C.E. Stroud, N. A. Touba, Elsevier, Morgan Kaufmann Publishers, 2009.
Digital System Testing and Testable Design by M. Abramovici, M. A. Breuer, and A.D. Friedman, IEEE Press, New York, 1990, 652 pages
